The focus of this session will examine the technical realities and origins of 60 Hz leakage (or “touch”) currents and the necessary, multiple and highly unlikely conductive pathways that need to exist before any form of shock hazard presents itself. Participants will learn how to bring a thorough and structured approach to device-related investigations from the scientific, ethical, moral, regulatory and legal perspectives. While these viewpoints are all interrelated, they can have opposing objectives. The accidental risk of damaging or destroying potential evidence will be emphasized.
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