March was a busy month for the TechNation Webinar Wednesday series.
The March Madness started with “Best Practices When Testing Electrosurgical Units” on March 9. It was presented by Fluke Biomedical’s Jerry Zion and Shirin Khanna. They focused on testing electrosurgical units.
The webinar covered the 10 best practices for testing ESUs, common errors and how to avoid them. The latest technology in testing ESUs was also discussed.
The webinar was a hit with the 426 people watching the presentation.
The series continued the following week with “Staving Off End of Life: Tips and tricks for maintaining your SPECT system,” presented by Craig Diener. He reviewed avenues to protect nuclear medicine imaging systems. He also shared effective ways to troubleshoot common SPECT system issues and addressed common part failures for four different cameras.
Diener, senior product manager at Universal Medical Resources Inc., shared knowledge he has acquired during his more than two decades working in nuclear medicine, including 19 years working with an OEM in multiple capacities.
The webinar, sponsored by Universal Medical Resources Inc. (UMRi), also included a Q&A session hosted by Universal’s Panel of Experts (Mike Hill, Kevin Borr and Chad Watson).
The next webinar set a 2016 attendance record.
More than 500 people attended the Webinar Wednesday session presented by Jim Rickner and sponsored by Conquest Imaging. The webinar “NFPA 99 Electrical Safety, A Biomed’s Perspective” received great reviews among attendees who praised Rickner’s presentation and the Webinar Wednesday series.
In the webinar, Rickner stressed the importance of performing NFPA 99 electrical safety checks on medical devices across all modalities. He provided an introduction to concepts of NFPA 99 and how to apply these concepts to medical devices.
A popular topic was revisited on March 30 when Fluke Biomedical’s Jerry Zion presented “Why Metrology Matters in MDQA Testing: An introduction to metrology for MDQA.” The webinar expanded on a 2015 webinar.
Zion, the global training manager for Fluke Biomedical, talked about the importance of metrology and how it applies to medical device quality assurance testing. He also covered the concept of uncertainties and how they affect calibration adjustments. An explanation of how metrology and traceability apply to test instruments and medical devices upon which calibration adjustments are made was another interesting part of the session. The free webinar was made possible thanks to sponsor Fluke Biomedical. An informative Q&A session followed Zion’s prepared presentation.
For information about upcoming webinars, or to view a recording of this webinar, visit 1TechNation.com/webinars.
TechNation Webinar Wednesday would like to thank our March sponsors, Fluke Biomedical, UMRI and Conquest Imaging.